TECHNICAL SESSION (TS) I.5
15.00-16.30
| I.5.1 | Antonio CASARES (Carl Zeiss Microscopy) New Developments and Applications of High Resolution X-ray Microscopy |
| I.5.2 | Antonio CASARES (Carl Zeiss Microscopy) Advances in X-ray Microscopy for Materials Characterization Spanning Time Scales, Length Scales, and Modalities |
| I.5.3 | Matteo FERRONI (Università degli Studi di Brescia) STEM tomography in the scanning electron microscope |
| I.5.4 | Michele NACUCCHI (ENEA, Centro di Ricerca di Brindisi) Structural analysis of advanced polymeric foams by HR X-ray CT |
