Artifacts in SPM
Cristiano ALBONETTI
(CNR – ISMN)
Abstract:
Artifacts of scanning probe microscopy will be presented. The tip artifact, where the sample topography is convoluted with the tip geometry, is the most common artifact. A second class of artifacts are topography images, which are influenced by local variations in properties such as conductance, elasticity, adhesion or friction. The third class of artifacts are local measurements, for instance lateral force measurements, which are influenced by the local topography. The fourth class of artifacts are instrumental. Some illustrative SPM images with artifacts will be discussed for identifying them.
