Viale V. Lancetti, 43
20158 Milano (MI), ITALIA
Tel. + 39 02 70636370
Fax +39 02 2361294
Sito web
Contact person: Cristian Vailati
Contact person: Francesco Biancardi
Email This email address is being protected from spambots. You need JavaScript enabled to view it.

Bruker has been driven by the idea to always provide the best technological solution for each analytical task for more than 50 years now. Today, worldwide more than 6,000 employees are working on this permanent challenge at over 90 locations on all continents.

Being one of the world's leading analytical instrumentation companies, Bruker is strongly committed to further fully meet its customers’ needs as well as to continue to develop state-of-the-art technologies and innovative solutions for today's analytical questions.

Bruker is market leader in many fields of application, one being the surface characterization at the micro and nanoscale, with its product lines of Atomic Force Microscopy AFM (sole company in the world manufacturing both microscopes and probes), tribology, mechanical testing, nanoindentation, stylus and optical profilometry, Micro X-ray Fluorescence Spectrometry (Micro-XRF), Total Reflection X-ray Fluorescence Spectrometry (T-XRF) and Electron Microscopy Analyzers (EDS, WDS, EBSD, Micro-XRF on SEM and Micro-CT for SEM).

In the field of AFMs, Bruker’s latest advancements include the proprietary Peak Force Tapping® technologies of PeakForce QNM®, PeakForce Capture® , PeakForce TUNA, PeakForce KPFM, ScanAsyst®. The recently introduced PeakForce IR™ for the simultaneous analysis of the mechanical and chemical properties at the nanoscale allow the researcher to reach higher performances than any other commercial system in terms of resolution, accuracy, quality of the analysis, for all the range of applications from material analysis to biology.

QUANTAX Micro-XRF with the XTrace micro-spot X-ray source adds the capabilities of a complete micro-XRF spectrometer to a scanning electron microscope. XTrace fits on a free inclined chamber port of almost any SEM. The user benefits from both the trace element sensitivity and the higher information depth of XRF analysis.

For more information, do not hesitate to contact us at This email address is being protected from spambots. You need JavaScript enabled to view it. or visit our website


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