TECHNICAL SESSION (TS) II.1
17.00-18.30
II.1.1 | Ilaria ZAMPRONI (Emme3) Jeremy REES (Cambridge Nanoscience Limited, UK) Materials Sample Preparation for TEM - Why choose sectioning techniques? |
II.1.2 | Vrettos STELLIOU (NanoMegas) Precession Electron Diffraction Applications in TEM: from crystal structure determination to orientation imaging and strain mapping at nm scale |
II.1.3 | Giacomo COZZI (Nikon Italia) Optical nanoscopy: the super Resolution techniques |
II.1.4 | Cristiano ALBONETTI (CNR – ISMN) Artifacts in SPM |
II.1.5 | Livia ANGELONI (Sapienza Università di Roma and Laval University) Advances in magnetic force microscopy: application to superparamagnetic nanopartiles |