Umberto CELANO
Umberto CELANO
(IMEC, Belgium)
Umberto Celano received his B.Sc. degree in Electronic Engineering in 2009 from Sapienza University of Rome, Italy, as well as his M.Sc. degree in Nanoelectronic Engineering (with honors). He is pursuing a Ph.D. degree at the KU Leuven performing his research at imec on metrology and physical mechanisms of emerging memory devices. Umberto’s research aims to overcome traditional limitation of electrical scanning probe techniques by developing concepts to transition from 2D-observation toward the 3D characterization of nano-sized volumes. He obtained the IEDM 2013 Roger A. Haken Best Student Paper Award for his work ‘Conductive-AFM tomography for 3D filament observation in resistive switching devices’. He is member of the metrology working-group in the International Technology Roadmap for Semiconductors (ITRS) and scientific coordinator for the nanotechnology program of University of Roma ‘Sapienza’ at imec. Currently his research activity focuses on transport in Poly-Si vertical channel for 3D NAND, ionic-based resistive switching and vacancy modulated resistive memories.
